Scaling Effects on Thermal and Gate Induced Noise of Small Geometry LDD Mosfets
EKTA KALRA, ANIL KUMAR, SUBHASIS HALDAR∗, AND R.S.GUPTA Sr. Member IEEE, Fellow IETE.
SEMICONDUCTOR DEVICE RESEARCH LABORATORY DEPARTMENT OF ELECTRONIC SCIENCE UNIVERSITY OF DELHI SOUTH CAMPUS NEW DELHI-110021,INDIA ∗DEPARTMENT OF PHYSICS, MOTI LAL NEHRU COLLEGE BENITO JUAREZ ROAD, NEW DELHI-110021